Hardware in Loop Testing for After Treatment Solutions
DOI:
https://doi.org/10.53555/eee.v2i11.387Keywords:
Hardware in Loop testing,, After treatment Process,, dSPACE, Data logging, Emission controlAbstract
The Hardware in loop (HIL) testing is a simulation technique that is used in the development and testing of Engine control module (ECM) as the real time embedded control system. The ECM control module, which controls all electrical subsystems related to an automotive. It controls two subsystems namely Regeneration System (CRS) and Selective Catalytic Reduction (SCR). Manual testing and automatic testing methods are incorporated using various testing tools and test result monitoring software. Testing also includes GUI based script development for conventional and frequent test methods using python scripting in the back end.
Downloads
References
Ambalal V. Patel,Vijay V. Patel,Girish Deodhare(2014),Clearance of Flight Control System Software with Hardware in Loop Test Platform, Journal of Aircraft,51(3),pp.748-760.
Yang, H., Tsourapas, V., K, P., Yuan, Q et al (2009),Hardware In the Loop(HIL)Modeling and Simulation for Diesel After treatment Controls Development, SAE Technical Paper 2009012928, doi:10.4271/2009012928
Tino Schulze, JannEve Stavesand(2016,May,12-13), Hardware in the Loop Test Process for Modern E/E
Systems, Springer International Publishing, 7th Conference, Berlin,pp343-360.
Renuka M. Kulkarni, Rohita. P. Patil, Chidambar Rao Bhukya(2016), Hardware–In–Loop Test Bench Based Failure Mode Effects Test Automation, International Journal of Innovative Research in Electrical, Electronics, Instrumentation and Control Engineering ,4(6),pp.217-220
Eckard Bringmann, Andreas Krämer(2008,April 9-11), Model-based Testing of Automotive Systems, International Conference on Software Testing, Verification, and Validation, DOI 10.1109/ICST.2008.45,pp.485-493
Giancarmine Fasano, Domenico Accardo, Lidia Forlenza, Alfredo Renga, Giancarlo Runo, Urbano Tancredi, and Antonio Moccia(2013),Real-Time Hardware-in-the-Loop Laboratory Testing for Multisensor Sense and Avoid Systems, International Journal of Aerospace Engineering, Article ID 748751.
Mr. Abhijeet Taksale, Mr. Vishwas Vaidya, Mrs. Priti Shahane, Mr. Goutham Dronamraju, Mr. Vivek Deulkar(2015,May, 28),Low cost Hardware-in-Loop for Automotive Application, IEEE International Conference on Industrial Instrumentation and Control (ICIC), pp 1109-1114.
